"BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting."

Shreyas Sen et al. (2012)

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DOI: 10.1007/S10836-012-5304-5

access: closed

type: Journal Article

metadata version: 2020-09-11

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Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Shyam Kumar Devarakond, Hyun Woo Choi, Abhijit Chatterjee:
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting. J. Electron. Test. 28(4): 405-419 (2012)

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