"On-chip testing of random access memories."

Kewal K. Saluja (1994)

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DOI: 10.1007/BF00972520

access: closed

type: Journal Article

metadata version: 2020-09-11

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Kewal K. Saluja:
On-chip testing of random access memories. J. Electron. Test. 5(4): 367-376 (1994)

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