"Testing for Bounded Faults in RAMs."

René David, Janusz A. Brzozowski, Helmut Jürgensen (1997)

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DOI: 10.1023/A:1008263507929

access: closed

type: Journal Article

metadata version: 2024-08-05

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René David, Janusz A. Brzozowski, Helmut Jürgensen:
Testing for Bounded Faults in RAMs. J. Electron. Test. 10(3): 197-214 (1997)

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