"An edge-located uniform pattern recovery mechanism using statistical ..."

Shaokun Lan et al. (2023)

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DOI: 10.1016/J.ESWA.2023.119763

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type: Journal Article

metadata version: 2023-06-26

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Shaokun Lan, Hongcheng Fan, Shiqi Hu, Xincheng Ren, Xuewen Liao, Zhibin Pan:
An edge-located uniform pattern recovery mechanism using statistical feature-based optimal center pixel selection strategy for local binary pattern. Expert Syst. Appl. 221: 119763 (2023)

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