"AFM Imaging Defect Detection and Classification Using Deep Learning."

Juntao Zhang, Juan Ren, Shuiqing Hu (2024)

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DOI: 10.1109/ACCESS.2024.3459868

access: open

type: Journal Article

metadata version: 2024-10-03

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Juntao Zhang, Juan Ren, Shuiqing Hu:
AFM Imaging Defect Detection and Classification Using Deep Learning. IEEE Access 12: 132027-132037 (2024)

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