"Very Low Voltage Testing of SOI Integrated Circuits."

Eric W. MacDonald, Nur A. Touba (2002)

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DOI: 10.1109/VTS.2002.1011106

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Eric W. MacDonald, Nur A. Touba:
Very Low Voltage Testing of SOI Integrated Circuits. VTS 2002: 25-30

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