"On the Evaluation of Arbitrary Defect Coverage of Test Sets."

Ankur Jain et al. (1999)

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DOI: 10.1109/VTEST.1999.766699

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ankur Jain, Michael S. Hsiao, Vamsi Boppana, Masahiro Fujita:
On the Evaluation of Arbitrary Defect Coverage of Test Sets. VTS 1999: 426-432

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