"Testing Flash Memories for Tunnel Oxide Defects."

Mohammad Gh. Mohammad, Kewal K. Saluja (2008)

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DOI: 10.1109/VLSI.2008.41

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Mohammad Gh. Mohammad, Kewal K. Saluja:
Testing Flash Memories for Tunnel Oxide Defects. VLSI Design 2008: 157-162

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