"Reducing test time for 3D-ICs by improved utilization of test elevators."

Sreenivaas S. Muthyala, Nur A. Touba (2014)

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DOI: 10.1109/VLSI-SOC.2014.7004157

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Sreenivaas S. Muthyala, Nur A. Touba:
Reducing test time for 3D-ICs by improved utilization of test elevators. VLSI-SoC 2014: 1-6

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