"Bilevel Distance Metric Learning for Robust Image Recognition."

Jie Xu et al. (2018)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2021-01-21

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  dblp key:
  - conf/nips/XuLDH18
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Jie Xu, Lei Luo, Cheng Deng, Heng Huang:
Bilevel Distance Metric Learning for Robust Image Recognition. NeurIPS 2018: 4202-4211

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