"Mining IC test data to optimize VLSI testing."

Tony Fountain, Thomas G. Dietterich, Bill Sudyka (2000)

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DOI: 10.1145/347090.347099

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Tony Fountain, Thomas G. Dietterich, Bill Sudyka:
Mining IC test data to optimize VLSI testing. KDD 2000: 18-25

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