"Four Multi Probing Test for 16 Bit DAC with Vertical Contact Probe Card."

Seiji Sasho, Teruhisa Sakata (1996)

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DOI: 10.1109/TEST.1996.556948

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Seiji Sasho, Teruhisa Sakata:
Four Multi Probing Test for 16 Bit DAC with Vertical Contact Probe Card. ITC 1996: 86-91

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