"An Analysis of Tungsten Probes' Effect on Yield in a Production Wafer ..."

Norman Nadeau, Sylvie Perreault (1989)

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DOI: 10.1109/TEST.1989.82296

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Norman Nadeau, Sylvie Perreault:
An Analysis of Tungsten Probes' Effect on Yield in a Production Wafer Probe Environment. ITC 1989: 208-215

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