"Delay testing of SOI circuits: Challenges with the history effect."

Eric W. MacDonald, Nur A. Touba (1999)

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DOI: 10.1109/TEST.1999.805640

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Eric W. MacDonald, Nur A. Touba:
Delay testing of SOI circuits: Challenges with the history effect. ITC 1999: 269-275

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