"Delay test of chip I/Os using LSSD boundary scan."

Pamela S. Gillis et al. (1998)

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DOI: 10.1109/TEST.1998.743140

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Pamela S. Gillis, Francis Woytowich, Kevin McCauley, Ulrich Baur:
Delay test of chip I/Os using LSSD boundary scan. ITC 1998: 83-90

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