"Modeling the probability of defect excitation for a commercial IC with ..."

Jennifer Dworak et al. (1999)

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DOI: 10.1109/TEST.1999.805836

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer:
Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. ITC 1999: 1031-1037

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