"Optimized Instruction Set Architecture for Programmable Memory Test ..."

Seokmin Park, Jewoo Park, Young-Woo Lee (2024)

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DOI: 10.1109/ISOCC62682.2024.10762495

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-19

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Seokmin Park, Jewoo Park, Young-Woo Lee:
Optimized Instruction Set Architecture for Programmable Memory Test Pattern Generation. ISOCC 2024: 404-405

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