"Assessing intrinsic and extrinsic end-of-life risk using functional SRAM ..."

Yoann Mamy Randriamihaja et al. (2015)

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DOI: 10.1109/IRPS.2015.7112759

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-18

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Yoann Mamy Randriamihaja, William McMahon, S. Balasubramanian, Tanya Nigam, Biju Parameshwaran, Randy W. Mann, Torsten Klick, T. Schaefer, A. Kumar, Y. Song, Vivek Joshi, Rakesh Ranjan, F. Chen:
Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing. IRPS 2015: 6

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