default search action
"Static Noise Margin in 16 nm FinFET 6T and 8T SRAM Cells for ..."
Lorenzo Stevenazzi, Andrea Baschirotto, Marcello De Matteis (2023)
- Lorenzo Stevenazzi, Andrea Baschirotto, Marcello De Matteis:
Static Noise Margin in 16 nm FinFET 6T and 8T SRAM Cells for Compute-in-Memory. ICECS 2023: 1-4
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.