"Generating Compact Robust and Non-Robust Tests for Complete Coverage of ..."

Dong Xiang et al. (2006)

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DOI: 10.1109/ICCD.2006.4380854

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Dong Xiang, Kaiwei Li, Hideo Fujiwara, Jiaguang Sun:
Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests. ICCD 2006: 446-451

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