"Multi-Wafer Virtual Probe: Minimum-cost variation characterization by ..."

Wangyang Zhang et al. (2010)

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DOI: 10.1109/ICCAD.2010.5654349

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-21

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Wangyang Zhang, Xin Li, Emrah Acar, Frank Liu, Rob A. Rutenbar:
Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation. ICCAD 2010: 47-54

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