"Evolutionary failing-test generation for modern microprocessors."

Ernesto Sánchez, Giovanni Squillero, Alberto Paolo Tonda (2011)

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DOI: 10.1145/2001858.2001985

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Ernesto Sánchez, Giovanni Squillero, Alberto Paolo Tonda:
Evolutionary failing-test generation for modern microprocessors. GECCO (Companion) 2011: 225-226

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