"On path selection for delay fault testing considering operating conditions ..."

Bharath Seshadri et al. (2003)

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DOI: 10.1109/ETW.2003.1231681

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Bharath Seshadri, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu:
On path selection for delay fault testing considering operating conditions [logic IC testing]. ETW 2003: 141-146

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