"Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) ..."

Kihyuk Han et al. (2009)

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DOI: 10.1109/ETS.2009.20

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh:
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. ETS 2009: 129-134

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