"Multi-valued logic test access mechanism for test time and power reduction."

Amirreza Nekooei, Zainalabedin Navabi (2015)

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DOI: 10.1109/DTIS.2015.7127351

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Amirreza Nekooei, Zainalabedin Navabi:
Multi-valued logic test access mechanism for test time and power reduction. DTIS 2015: 1-6

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