"Reducing Test Point Area for BIST through Greater Use of Functional ..."

Joon-Sung Yang, Benoit Nadeau-Dostie, Nur A. Touba (2009)

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DOI: 10.1109/DFT.2009.33

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Joon-Sung Yang, Benoit Nadeau-Dostie, Nur A. Touba:
Reducing Test Point Area for BIST through Greater Use of Functional Flip-Flops to Drive Control Points. DFT 2009: 20-28

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