"Partial Error Masking to Reduce Soft Error Failure Rate in Logic Circuits."

Kartik Mohanram, Nur A. Touba (2003)

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DOI: 10.1109/DFTVS.2003.1250141

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kartik Mohanram, Nur A. Touba:
Partial Error Masking to Reduce Soft Error Failure Rate in Logic Circuits. DFT 2003: 433-

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