"Data Compression for System-on-Chip Testing Using ATE."

Farzin Karimi et al. (2002)

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DOI: 10.1109/DFTVS.2002.1173513

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Farzin Karimi, Waleed Meleis, Zainalabedin Navabi, Fabrizio Lombardi:
Data Compression for System-on-Chip Testing Using ATE. DFT 2002: 166-176

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