"Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with ..."

Nahmsuk Oh et al. (2003)

> Home

Details and statistics

DOI: 10.1109/DATE.2003.10128

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/date/OhKWS03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/OhKWS03
Nahmsuk Oh, Rohit Kapur, Thomas W. Williams, Jim Sproch:
Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture. DATE 2003: 10110-10115

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.