"Hierarchical Current Density Verification for Electromigration Analysis in ..."

Goeran Jerke, Jens Lienig (2002)

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DOI: 10.1109/DATE.2002.998314

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Goeran Jerke, Jens Lienig:
Hierarchical Current Density Verification for Electromigration Analysis in Arbitrary Shaped Metallization Patterns of Analog Circuits. DATE 2002: 464-469

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