"Low Power Test Compression Technique for Designs with Multiple Scan Chain."

Youhua Shi et al. (2005)

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DOI: 10.1109/ATS.2005.76

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki, Shinji Kimura:
Low Power Test Compression Technique for Designs with Multiple Scan Chain. Asian Test Symposium 2005: 386-389

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