"An Adaptive BIST to Detect Multiple Stuck-Open Faults in CMOS circuits."

Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya (1999)

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DOI: 10.1109/ASPDAC.1999.760015

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya:
An Adaptive BIST to Detect Multiple Stuck-Open Faults in CMOS circuits. ASP-DAC 1999: 287-

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