"All-digital PMOS and NMOS process variability monitor utilizing buffer ..."

Jaehyun Jeong et al. (2011)

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DOI: 10.1109/ASPDAC.2011.5722297

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Jaehyun Jeong, Tetsuya Iizuka, Toru Nakura, Makoto Ikeda, Kunihiro Asada:
All-digital PMOS and NMOS process variability monitor utilizing buffer ring with pulse counter. ASP-DAC 2011: 79-80

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