"Test Coverage Metric for Two-Staged Language with Abstract Interpretation."

Taeksu Kim et al. (2009)

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DOI: 10.1109/APSEC.2009.46

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Taeksu Kim, Chunwoo Lee, Kiljoo Lee, Soohyun Baik, Chisu Wu, Kwangkeun Yi:
Test Coverage Metric for Two-Staged Language with Abstract Interpretation. APSEC 2009: 301-308

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