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2010 – 2019
- 2012
[j3]Jing Zeng, Ruifeng Guo
, Wu-Tung Cheng, Michael Mateja, Jing Wang:
Scan-Based Speed-Path Debug for a Microprocessor. IEEE Des. Test Comput. 29(4): 92-99 (2012)- 2010
- [c10]Janine Chen, Jing Zeng, Li-C. Wang, Michael Mateja:
Correlating system test Fmax with structural test Fmax and process monitoring measurements. ASP-DAC 2010: 419-424 - [c9]Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz:
Scan based speed-path debug for a microprocessor. ETS 2010: 207-212 - [c8]Jing Zeng, Jing Wang, Chia-Ying Chen, Michael Mateja, Li-C. Wang:
On evaluating speed path detection of structural tests. ISQED 2010: 570-576 - [c7]Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja:
Mining AC delay measurements for understanding speed-limiting paths. ITC 2010: 553-562 - [c6]Janine Chen, Jing Zeng, Li-C. Wang, Jeff Rearick, Michael Mateja:
Selecting the most relevant structural Fmax for system Fmax correlation. VTS 2010: 99-104
2000 – 2009
- 2009
- [c5]Janine Chen, Li-C. Wang, Po-Hsien Chang, Jing Zeng, S. Yu, Michael Mateja:
Data learning techniques and methodology for Fmax prediction. ITC 2009: 1-10 - [c4]Jing Zeng, Jing Wang, Michael Mateja:
A Path-Oriented Timing-Aware Diagnosis Methodology of At-Speed Transition Tests. MTV 2009: 49-54 - 2008
- [c3]Tim Wood, Grady Giles, Chris Kiszely, Martin Schuessler, Daniela Toneva, Joel Irby, Michael Mateja:
The Test Features of the Quad-Core AMD Opteron- Microprocessor. ITC 2008: 1-10 - 2000
- [j2]Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran:
Test Development for a Third-Version ColdFire Microprocessor. IEEE Des. Test Comput. 17(4): 29-37 (2000)
1990 – 1999
- 1999
- [c2]Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran:
The testability features of the 3rd generation ColdFire family of microprocessors. ITC 1999: 913-922 - 1998
- [j1]Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja:
Test Development for Second-Generation ColdFire Microprocessors. IEEE Des. Test Comput. 15(3): 70-76 (1998) - 1997
- [c1]Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason:
A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. ITC 1997: 424-432
Coauthor Index
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