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ORCIDSamvel K. Shoukourian
Person information
- unicode name: Սամվել Կիմի Շուքուրյան
- affiliation: Yerevan State University
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2020 – today
- 2023
[c26]Samvel K. Shoukourian, Tigran Grigoryan, Sevak Amirkhanyan:
Analytics for AI Related Applications of Multidimensional Multitape Finite Automata. CECNet 2023: 49-60- 2021
- [j10]Alexander Godlevsky, Hayk A. Grigoryan, Tigran Grigoryan, Samvel K. Shoukourian:
Some Results on Regular Events for Multitape Finite Automata: A Preliminary Report. Bull. EATCS 133 (2021) - 2020
- [j9]Hayk A. Grigoryan, Samvel K. Shoukourian:
Polynomial algorithm for equivalence problem of deterministic multitape finite automata. Theor. Comput. Sci. 833: 120-132 (2020) - [j8]Gurgen Harutyunyan
, Suren Martirosyan, Samvel K. Shoukourian, Yervant Zorian:
Memory Physical Aware Multi-Level Fault Diagnosis Flow. IEEE Trans. Emerg. Top. Comput. 8(3): 700-711 (2020)
2010 – 2019
- 2019
- [j7]Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 562-575 (2019) - [c25]Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Memory FIT Rate Mitigation Technique for Automotive SoCs. ITC 2019: 1-6 - [c24]Samvel K. Shoukourian, Yuri Shoukourian, Vladimir Sahakyan:
Armenia: Communicating to World Community in Electronic Test and Design. ITC 2019: 1-3 - [c23]S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan:
Innovative Practices on In-System Test and Reliability of Memories. VTS 2019: 1 - 2018
- [c22]Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides:
Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. ITC 2018: 1-6 - 2017
- [c21]Suren Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
An efficient testing methodology for embedded flash memories. EWDTS 2017: 1-4 - [c20]D. Sargsyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Automated flow for test pattern creation for IPs in SoC. EWDTS 2017: 1-4 - [c19]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Experimental study on Hamming and Hsiao codes in the context of embedded applications. EWDTS 2017: 1-4 - 2016
- [c18]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Securing test infrastructure of system-on-chips. EWDTS 2016: 1-4 - 2015
- [c17]L. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
A power based memory BIST grouping methodology. EWDTS 2015: 1-4 - [c16]Vrezh Sargsyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Avetik Yessayan:
An efficient approach for memory repair by reducing the number of spares. EWDTS 2015: 1-4 - [c15]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Overview study on fault modeling and test methodology development for FinFET-based memories. EWDTS 2015: 1-4 - [e1]Nelson Baloian, Yervant Zorian, Perouz Taslakian, Samvel K. Shoukourian:
Collaboration and Technology - 21st International Conference, CRIWG 2015, Yerevan, Armenia, September 22-25, 2015, Proceedings. Lecture Notes in Computer Science 9334, Springer 2015, ISBN 978-3-319-22746-7 [contents] - 2014
- [c14]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Extending fault periodicity table for testing faults in memories under 20nm. EWDTS 2014: 1-4 - 2013
- [c13]K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Application of defect injection flow for fault validation in memories. EWDTS 2013: 1-4 - [c12]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Impact of process variations on read failures in SRAMs. EWDTS 2013: 1-4 - [c11]T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. EWDTS 2013: 1-4 - [c10]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An effective solution for building memory BIST infrastructure based on fault periodicity. VTS 2013: 1-6 - 2012
- [j6]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 941-949 (2012) - 2011
- [j5]Gurgen Harutunyan, Aram Hakhumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Symmetry Measure for Memory Test and Its Application in BIST Optimization. J. Electron. Test. 27(6): 753-766 (2011) - [c9]K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium 2011: 461-462 - [c8]Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Generic BIST architecture for testing of content addressable memories. IOLTS 2011: 86-91 - 2010
- [c7]Alexander A. Letichevsky, Arsen S. Shoukourian, Samvel K. Shoukourian:
The Equivalence Problem of Deterministic Multitape Finite Automata: A New Proof of Solvability Using a Multidimensional Tape. LATA 2010: 392-402
2000 – 2009
- 2009
- [c6]Armen Kostanyan, Vardan Matevosyan, Samvel K. Shoukourian, Anna Varosyan:
An approach for formal verification of business processes. SpringSim 2009 - 2008
- [j4]Haik Grigorian, Samvel K. Shoukourian:
The equivalence problem of multidimensional multitape automata. J. Comput. Syst. Sci. 74(7): 1131-1138 (2008) - 2006
- [c5]Levon Hayrapetyan, Samvel K. Shoukourian:
Alternative Combination of Processes. PDPTA 2006: 576-582 - 2004
- [j3]Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure. IEEE Des. Test Comput. 21(3): 200-207 (2004) - [c4]Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A Methodology for Design and Evaluation of Redundancy Allocation Algorithms. VTS 2004: 249-260 - 2003
- [j2]Yervant Zorian, Samvel K. Shoukourian:
Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield. IEEE Des. Test Comput. 20(3): 58-66 (2003) - 2001
- [c3]Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An Approach for Evaluation of Redunancy Analysis Algorithms. MTDT 2001: 51-
1990 – 1999
- 1999
- [c2]Samvel K. Shoukourian, A. M. Vasilyan, A. A. Avagyan, A. K. Shukurian:
An Approach for Access Differentiation Design in Medical Distributed Applications Built on Databases. MIE 1999: 78-82 - 1998
- [j1]Samvel K. Shoukourian:
A Unified Design Methodology for Offline and Online Testing. IEEE Des. Test Comput. 15(2): 73-79 (1998) - 1995
- [c1]Samvel K. Shoukourian, Armen G. Kostanian, Valery A. Margarian, Ayman A. Ashour:
An approach for system tests design and its application. VTS 1995: 448-453
Coauthor Index
aka: Gurgen Harutyunyan
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