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ORCIDArjun Chaudhuri
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2020 – today
- 2024
[j10]Shao-Chun Hung
, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty:
Fault Diagnosis for Resistive Random Access Memory and Monolithic Inter-Tier Vias in Monolithic 3-D Integration. IEEE Trans. Very Large Scale Integr. Syst. 32(7): 1336-1349 (2024)- [i4]Jayeeta Chaudhuri, Dhruv Thapar, Arjun Chaudhuri, Farshad Firouzi, Krishnendu Chakrabarty:
SPICED: Syntactical Bug and Trojan Pattern Identification in A/MS Circuits using LLM-Enhanced Detection. CoRR abs/2408.16018 (2024) - 2023
- [j9]Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty:
Transferable Graph Neural Network-Based Delay-Fault Localization for Monolithic 3-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(11): 4296-4309 (2023) - [j8]Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty:
Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 31(3): 296-309 (2023) - [c32]Jonti Talukdar, Arjun Chaudhuri, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty:
Securing Heterogeneous 2.5D ICs Against IP Theft through Dynamic Interposer Obfuscation. DATE 2023: 1-2 - [c31]Shao-Chun Hung, Arjun Chaudhuri, Krishnendu Chakrabarty:
Test-Point Insertion for Power-Safe Testing of Monolithic 3D ICs using Reinforcement Learning*. ETS 2023: 1-6 - [c30]Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty:
Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs. ITC 2023: 216-225 - [c29]Dhruv Thapar, Simon Thomann, Arjun Chaudhuri, Hussam Amrouch, Krishnendu Chakrabarty:
Analysis and Characterization of Defects in FeFETs. ITC 2023: 256-265 - [c28]Arjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Krishnendu Chakrabarty:
Functional Test Generation for AI Accelerators using Bayesian Optimization∗. VTS 2023: 1-6 - [c27]Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty:
Special Session: Using Graph Neural Networks for Tier-Level Fault Localization in Monolithic 3D ICs *. VTS 2023: 1-4 - [c26]Fei Su, Eric Zhang, Arjun Chaudhuri, Michael Paulitsch:
Innovation Practices Track: Testability and Dependability of AI Hardware and Autonomous Systems. VTS 2023: 1 - [i3]Mingjie Liu, Teodor-Dumitru Ene, Robert Kirby, Chris Cheng, Nathaniel Ross Pinckney, Rongjian Liang, Jonah Alben, Himyanshu Anand, Sanmitra Banerjee, Ismet Bayraktaroglu, Bonita Bhaskaran, Bryan Catanzaro, Arjun Chaudhuri, Sharon Clay, Bill Dally, Laura Dang, Parikshit Deshpande, Siddhanth Dhodhi, Sameer Halepete, Eric Hill, Jiashang Hu, Sumit Jain, Brucek Khailany, Kishor Kunal, Xiaowei Li, Hao Liu, Stuart F. Oberman, Sujeet Omar, Sreedhar Pratty, Jonathan Raiman, Ambar Sarkar, Zhengjiang Shao, Hanfei Sun, Pratik P. Suthar, Varun Tej, Kaizhe Xu, Haoxing Ren:
ChipNeMo: Domain-Adapted LLMs for Chip Design. CoRR abs/2311.00176 (2023) - 2022
- [b1]Arjun Chaudhuri:
Fault Modeling, Design-for-Test, and Fault Tolerance for Machine Learning Hardware. Duke University, Durham, NC, USA, 2022 - [j7]Lingjun Zhu, Arjun Chaudhuri, Sanmitra Banerjee, Gauthaman Murali, Pruek Vanna-Iampikul, Krishnendu Chakrabarty, Sung Kyu Lim:
Design Automation and Test Solutions for Monolithic 3D ICs. ACM J. Emerg. Technol. Comput. Syst. 18(1): 21:1-21:49 (2022) - [j6]Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Heechun Park, Bon Woong Ku, Sukeshwar Kannan, Krishnendu Chakrabarty, Sung Kyu Lim:
Built-in Self-Test and Fault Localization for Inter-Layer Vias in Monolithic 3D ICs. ACM J. Emerg. Technol. Comput. Syst. 18(1): 22:1-22:37 (2022) - [j5]Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty:
C-Testing and Efficient Fault Localization for AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 2348-2361 (2022) - [j4]Arjun Chaudhuri, Jonti Talukdar, Fei Su, Krishnendu Chakrabarty:
Functional Criticality Analysis of Structural Faults in AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(12): 5657-5670 (2022) - [c25]Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty:
Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs. DATE 2022: 448-453 - [c24]Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty:
Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs. DATE 2022: 1311-1316 - [c23]Jonti Talukdar, Arjun Chaudhuri, Krishnendu Chakrabarty:
TaintLock: Preventing IP Theft through Lightweight Dynamic Scan Encryption using Taint Bits*. ETS 2022: 1-6 - [c22]Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty:
Machine Learning for Testing Machine-Learning Hardware: A Virtuous Cycle. ICCAD 2022: 160:1-160:6 - [c21]Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty:
Structural Test Generation for AI Accelerators using Neural Twins. IOLTS 2022: 1-6 - [c20]Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty:
Probabilistic Fault Grading for AI Accelerators using Neural Twins. ISVLSI 2022: 333-338 - [c19]Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty:
Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration. ITC 2022: 118-127 - [c18]Jonti Talukdar, Arjun Chaudhuri, Mayukh Bhattacharya, Krishnendu Chakrabarty:
Automatic Structural Test Generation for Analog Circuits using Neural Twins. ITC 2022: 145-154 - [c17]Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty:
Special Session: Fault Criticality Assessment in AI Accelerators. VTS 2022: 1-4 - 2021
- [j3]Sanmitra Banerjee, Arjun Chaudhuri, August Ning, Krishnendu Chakrabarty:
Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits. IEEE Trans. Very Large Scale Integr. Syst. 29(2): 409-422 (2021) - [c16]Sanmitra Banerjee, Arjun Chaudhuri, Shao-Chun Hung, Krishnendu Chakrabarty:
Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits. DATE 2021: 152-157 - [c15]Arjun Chaudhuri, Jonti Talukdar, Jinwook Jung, Gi-Joon Nam, Krishnendu Chakrabarty:
Fault-Criticality Assessment for AI Accelerators using Graph Convolutional Networks. DATE 2021: 1596-1599 - [c14]Sanmitra Banerjee, Arjun Chaudhuri, Jinwoo Kim, Gauthaman Murali, Mark Nelson, Sung Kyu Lim, Krishnendu Chakrabarty:
ParaMitE: Mitigating Parasitic CNFETs in the Presence of Unetched CNTs. ICCAD 2021: 1-9 - [c13]Arjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Siddarth Madala, Abhishek Kumar Dubey, Krishnendu Chakrabarty:
Efficient Fault-Criticality Analysis for AI Accelerators using a Neural Twin∗. ITC 2021: 73-82 - [c12]Arjun Chaudhuri, Krishnendu Chakrabarty:
Testing and Fault-Localization Solutions for Monolithic 3D ICs*. ITC-Asia 2021: 1-6 - 2020
- [j2]Arjun Chaudhuri, Sanmitra Banerjee, Heechun Park, Jinwoo Kim, Gauthaman Murali, Edward Lee, Daehyun Kim, Sung Kyu Lim, Saibal Mukhopadhyay, Krishnendu Chakrabarty:
Advances in Design and Test of Monolithic 3-D ICs. IEEE Des. Test 37(4): 92-100 (2020) - [j1]Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty:
Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs. IEEE Trans. Very Large Scale Integr. Syst. 28(6): 1513-1526 (2020) - [c11]Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty:
NodeRank: Observation-Point Insertion for Fault Localization in Monolithic 3D ICs∗. ATS 2020: 1-6 - [c10]Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty:
C-Testing of AI Accelerators *. ATS 2020: 1-6 - [c9]Jinwoo Kim, Gauthaman Murali, Pruek Vanna-Iampikul, Edward Lee, Daehyun Kim, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Saibal Mukhopadhyay, Sung Kyu Lim:
RTL-to-GDS Design Tools for Monolithic 3D ICs. ICCAD 2020: 126:1-126:8 - [c8]Arjun Chaudhuri, Jonti Talukdar, Fei Su, Krishnendu Chakrabarty:
Functional Criticality Classification of Structural Faults in AI Accelerators. ITC 2020: 1-5
2010 – 2019
- 2019
- [c7]Heechun Park, Kyungwook Chang, Bon Woong Ku, Jinwoo Kim, Edward Lee, Daehyun Kim, Arjun Chaudhuri, Sanmitra Banerjee, Saibal Mukhopadhyay, Krishnendu Chakrabarty, Sung Kyu Lim:
RTL-to-GDS Tool Flow and Design-for-Test Solutions for Monolithic 3D ICs. DAC 2019: 101 - [c6]Arjun Chaudhuri, Sanmitra Banerjee, Heechun Park, Bon Woong Ku, Krishnendu Chakrabarty, Sung Kyu Lim:
Built-in Self-Test for Inter-Layer Vias in Monolithic 3D ICs. ETS 2019: 1-6 - [c5]Arjun Chaudhuri, Mengyun Liu, Krishnendu Chakrabarty:
Fault-Tolerant Neuromorphic Computing Systems. ITC 2019: 1-10 - [c4]Arjun Chaudhuri, Bonan Yan, Yiran Chen, Krishnendu Chakrabarty:
Hardware Fault Tolerance for Binary RRAM Crossbars. ITC 2019: 1-10 - [c3]Arjun Chaudhuri, Sukeshwar Kannan, Luke England, Jack Golz:
Compact Scalable Dynamic TSV IR Drop Compensation for Power Delivery in 3D Packages. MWSCAS 2019: 1179-1182 - 2018
- [c2]Arjun Chaudhuri, Krishnendu Chakrabarty:
Analysis of Process Variations, Defects, and Design-Induced Coupling in Memristors. ITC 2018: 1-10 - 2017
- [c1]Anindya Shankar Bhandari, Arjun Chaudhuri, Swarnabha Roy, Shubham Negi, Mrigank Sharad:
Single chip self-tunable N-input N-output PID control system with integrated analog front-end for miniature robotics. ICNSC 2017: 109-114 - 2016
- [i2]Arjun Chaudhuri:
Selective De-noising of Sparse-Coloured Images. CoRR abs/1610.09455 (2016) - [i1]Anindya Shankar Bhandari, Arjun Chaudhuri, Mrigank Sharad:
Single Chip Self-Tunable N-Input N-Output PID Control System with Integrated Analog Front-end for Miniature Robotics. CoRR abs/1611.05164 (2016)
Coauthor Index
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last updated on 2024-09-30 00:09 CEST by the dblp team
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