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ORCIDAdrian Evans
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2020 – today
- 2024
[j5]Valentin Isaac-Chassande
, Adrian Evans, Yves Durand, Frédéric Rousseau:
Dedicated Hardware Accelerators for Processing of Sparse Matrices and Vectors: A Survey. ACM Trans. Archit. Code Optim. 21(2): 27 (2024)- [c28]Valentin Isaac-Chassande, Adrian Evans, Yves Durand, Frédéric Rousseau:
SpDCache: Region-Based Reduction Cache for Outer-Product Sparse Matrix Kernels. ASAP 2024: 3-7 - [c27]Mathieu Toubeix, Eric Guthmuller, Adrian Evans, Tristan Meunier:
A Scalable Low-Latency FPGA Architecture for Spin Qubit Control Through Direct Digital Synthesis. DATE 2024: 1-2 - [c26]César Fuguet, Eric Guthmuller, Andrea Bocco, Jérôme Fereyre, Adrian Evans, Yves Durand:
A Variable and Extended Precision (VRP) Accelerator and its 22 nm SoC Implementation. DCIS 2024: 1-6 - [c25]Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra:
New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405. ETS 2024: 1-10 - [i1]Yuqiang Lin, Sam Lockyer, Adrian Evans, Markus Zarbock, Nic Zhang:
City-Scale Multi-Camera Vehicle Tracking System with Improved Self-Supervised Camera Link Model. CoRR abs/2405.11345 (2024) - 2022
- [c24]Stéphane Burel, Adrian Evans, Lorena Anghel:
Improving DNN Fault Tolerance in Semantic Segmentation Applications. DFT 2022: 1-6 - 2021
- [c23]Stéphane Burel, Adrian Evans, Lorena Anghel:
Zero-Overhead Protection for CNN Weights. DFT 2021: 1-6 - [c22]Stéphane Burel, Adrian Evans, Lorena Anghel:
MOZART: Masking Outputs with Zeros for Architectural Robustness and Testing of DNN Accelerators. IOLTS 2021: 1-6
2010 – 2019
- 2017
- [c21]Yi Luo, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen:
IZIP: In-place zero overhead interconnect protection via PIP redundancy. ASICON 2017: 565-568 - [c20]Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
BPPT - Bulk potential protection technique for hardened sequentials. IOLTS 2017: 28-32 - [c19]Dan Alexandrescu, Adrian Evans, Maximilien Glorieux, Issam Nofal:
EDA support for functional safety - How static and dynamic failure analysis can improve productivity in the assessment of functional safety. IOLTS 2017: 145-150 - 2016
- [j4]Pedro Reviriego, Mustafa Demirci, Adrian Evans, Juan Antonio Maestro:
A Method to Design Single Error Correction Codes With Fast Decoding for a Subset of Critical Bits. IEEE Trans. Circuits Syst. II Express Briefs 63-II(2): 171-175 (2016) - [c18]Alessandro Savino, Stefano Di Carlo, Alessandro Vallero, Gianfranco Politano, Dimitris Gizopoulos, Adrian Evans:
RIIF-2: Toward the next generation reliability information interchange format. IOLTS 2016: 173-178 - [e1]Adrian Evans, Stefano Di Carlo, Praveen Raghavan, Dimitris Gizopoulos:
Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, ERMAVSS 2016, co-located with IEEE/ACM Design, Automation and Test in Europe Conference (DATE 2016), Dresden, Germany, March 18, 2016. CEUR Workshop Proceedings 1566, CEUR-WS.org 2016 [contents] - 2015
- [j3]Sheng Wang, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen:
New insights into the impact of SEUs in FPGA CRAMs. IEICE Electron. Express 12(6): 20150110 (2015) - [j2]Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Enrico Costenaro, Dan Alexandrescu, Vikas Chandra, Razi Seyyedi:
Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(10): 1586-1599 (2015) - [j1]Pedro Reviriego, Salvatore Pontarelli, Adrian Evans, Juan Antonio Maestro:
A Class of SEC-DED-DAEC Codes Derived From Orthogonal Latin Square Codes. IEEE Trans. Very Large Scale Integr. Syst. 23(5): 968-972 (2015) - [c17]Dan Alexandrescu, Adrian Evans, Enrico Costenaro, Maximilien Glorieux:
A call for cross-layer and cross-domain reliability analysis and management. IOLTS 2015: 19-22 - [c16]Adrian Evans, Enrico Costenaro, Arkady Bramnik:
Flip-flop SEU reduction through minimization of the temporal vulnerability factor (TVF). IOLTS 2015: 162-167 - [c15]Adrian Evans, Dan Alexandrescu, Veronique Ferlet-Cavrois, Kay-Obbe Voss:
Techniques for heavy ion microbeam analysis of FPGA SER sensitivty. IRPS 2015: 6 - [c14]Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung:
Analysis of advanced circuits for SET measurement. IRPS 2015: 7 - 2014
- [c13]Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Razi Seyyedi, Enrico Costenaro, Dan Alexandrescu:
Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales. DATE 2014: 1-6 - [c12]Ulf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn:
Connecting different worlds - Technology abstraction for reliability-aware design and Test. DATE 2014: 1-8 - [c11]Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong:
New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. IOLTS 2014: 62-68 - [c10]Dan Alexandrescu, Nematollah Bidokhti, Andy Yu, Adrian Evans, Enrico Costenaro:
Managing SER costs of complex systems through Linear Programming. IOLTS 2014: 216-219 - 2013
- [c9]Salvatore Pontarelli, Marco Ottavi, Adrian Evans, Shi-Jie Wen:
Error detection in ternary CAMs using bloom filters. DATE 2013: 1474-1479 - [c8]Adrian Evans, Dan Alexandrescu, Enrico Costenaro, Liang Chen:
Hierarchical RTL-based combinatorial SER estimation. IOLTS 2013: 139-144 - [c7]Dan Alexandrescu, Enrico Costenaro, Adrian Evans:
State-aware single event analysis for sequential logic. IOLTS 2013: 151-156 - [c6]Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Thiago Asis:
Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops. ISQED 2013: 727-732 - [c5]Hao Xie, Li Chen, Adrian Evans, Shi-Jie Wen, Rick Wong:
Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance. PRDC 2013: 128-129 - [c4]Adrian Evans, Michael Nicolaidis, Rob Aitken, Burcin Aktan, Olivier Lauzeral:
Hot topic session 4A: Reliability analysis of complex digital systems. VTS 2013: 1 - 2012
- [c3]Stefanos Valadimas, Yiorgos Tsiatouhas, Angela Arapoyanni, Adrian Evans:
Single event upset tolerance in flip-flop based microprocessor cores. DFT 2012: 79-84 - [c2]Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro:
RIIF - Reliability information interchange format. IOLTS 2012: 103-108
1990 – 1999
- 1998
- [c1]Adrian Evans, Allan Silburt, Gary Vrckovnik, Thane Brown, Mario Dufresne, Geoffrey Hall, Tung Ho, Ying Liu:
Functional Verification of Large ASICs. DAC 1998: 650-655
Coauthor Index
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