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ORCIDGiovanni Chiorboli
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2020 – today
- 2024
[j14]Giovanna Sozzi
, Giovanni Chiorboli, Lorenzo Perini, Roberta Nipoti:
Investigating Mesa Structure Impact on C-V Measurements. IEEE Access 12: 32938-32943 (2024)- [j13]Giovanna Sozzi, Sergio Sapienza, Giovanni Chiorboli, Lasse Vines, Anders Hallén, Roberta Nipoti:
Carrier Lifetime Dependence on Temperature and Proton Irradiation in 4H-SiC Device: An Experimental Law. IEEE Access 12: 74230-74238 (2024) - [c7]Danilo Santoro, Giovanni Chiorboli, Marco Bassani, Alessandro Andreani, Paolo Cova, Nicola Delmonte, Massimo Lazzaroni, Andrea Riminucci, Valeria Trabattoni, Andrea Zani:
Operational Amplifier Characterization at Cryogenic Temperatures. I2MTC 2024: 1-6 - [c6]Sadia Ali, Mattia Stighezza, Giovanni Chiorboli, Ilaria De Munari, Valentina Bianchi:
An Optimized Long Short Term Memory and Gaussian Process Regression Based Framework for State of Charge Estimation. MetroAutomotive 2024: 94-99 - 2023
- [j12]Valentina Bianchi, Mattia Stighezza, Andrea Toscani, Giovanni Chiorboli, Ilaria De Munari:
An Improved Method Based on Support Vector Regression With Application Independent Training for State of Charge Estimation. IEEE Trans. Instrum. Meas. 72: 1-11 (2023) - 2022
- [j11]Daniel Pinardi, Nicholas Rocchi, Andrea Toscani, Marco Binelli, Giovanni Chiorboli, Angelo Farina, Luca Cattani:
An Innovative Architecture of Full-Digital Microphone Arrays Over A²B Network for Consumer Electronics. IEEE Trans. Consumer Electron. 68(3): 200-208 (2022) - 2021
- [j10]Nicholas Rocchi, Andrea Toscani, Giovanni Chiorboli, Daniel Pinardi, Marco Binelli, Angelo Farina:
Transducer Arrays Over A²B Networks in Industrial and Automotive Applications: Clock Propagation Measurements. IEEE Access 9: 118232-118241 (2021) - [c5]Niccolò Mora, Federico Cocconcelli, Guido Matrella, Giovanni Chiorboli, Paolo Ciampolini:
An accurate and stable bed-based ballistocardiogram measurement and analysis system. MetroInd4.0&IoT 2021: 482-487
2010 – 2019
- 2016
- [c4]Antonio Affanni, Giovanni Chiorboli, Diego Minen:
Motion artifact removal in stress sensors used in "driver in motion" simulators. MeMeA 2016: 1-6 - 2010
- [j9]Cristiano Azzolini, Alessandro Magnanini, Matteo Tonelli, Giovanni Chiorboli, Carlo Morandi:
A CMOS vector lock-in amplifier for sensor applications. Microelectron. J. 41(8): 449-457 (2010)
2000 – 2009
- 2009
- [j8]Andrea Boni, Cristiano Azzolini, Davide Vecchi, Giovanni Chiorboli:
Single-Reference Foreground Calibration of High-Resolution, High-Speed Pipeline ADCs. Circuits Syst. Signal Process. 28(4): 487-504 (2009) - 2007
- [j7]Nicola Delmonte, B. E. Watts, Giovanni Chiorboli, Paolo Cova, Roberto Menozzi:
Test structures for dielectric spectroscopy of thin films at microwave frequencies. Microelectron. Reliab. 47(4-5): 682-685 (2007) - 2005
- [c3]Giovanni Chiorboli, Silvia Dondi, Carlo Morandi, Davide Vecchi:
DAC calibration by weighting capacitor rotation in a pipelined ADC. Circuits, Signals, and Systems 2005: 31-35 - 2003
- [j6]Giovanni Chiorboli:
Uncertainty of mean value and variance obtained from quantized data. IEEE Trans. Instrum. Meas. 52(4): 1273-1278 (2003) - 2002
- [j5]Giovanni Chiorboli:
Sub-picosecond aperture-uncertainty measurements [ADCs]. IEEE Trans. Instrum. Meas. 51(5): 1039-1044 (2002) - 2001
- [j4]Paolo Carbone, Giovanni Chiorboli:
ADC sinewave histogram testing with quasi-coherent sampling. IEEE Trans. Instrum. Meas. 50(4): 949-953 (2001)
1990 – 1999
- 1999
- [j3]Giovanni Chiorboli, Massimo Fontanili:
Cross-correlation noise measurements in A/D converters. IEEE Trans. Instrum. Meas. 48(6): 1282-1286 (1999) - 1998
- [j2]Giovanni Chiorboli, Massimo Fontanili, Carlo Morandi:
A new method for estimating the aperture uncertainty of A/D converters. IEEE Trans. Instrum. Meas. 47(1): 61-64 (1998) - [c2]Giovanni Chiorboli, Barbara De Salvo, Giovanni Franco, Carlo Morandi:
Some thoughts on the word error rate measurement of A/D converters. ICECS 1998: 453-456 - 1995
- [j1]Andrea Boni, Giovanni Chiorboli, G. Franco, M. Ostacoli, S. Mazzoleni:
Short test procedures for R-2R D/A converters by electrical modeling and application of the ambiguity algorithm. J. Electron. Test. 7(3): 145-155 (1995) - 1994
- [c1]Andrea Boni, Giovanni Chiorboli, G. Franco, S. Mazzoleni, M. Ostacoli:
Physical Modeling of Linearity Errors for the Diagnosis of High Resolution R-2R D/A Converters. EDAC-ETC-EUROASIC 1994: 664
Coauthor Index
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