"Analytical Soft Error Models Accounting for Die-to-Die and Within-Die ..."

Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry (2011)

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DOI: 10.1109/TVLSI.2009.2033697

access: closed

type: Journal Article

metadata version: 2020-03-11

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Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry:
Analytical Soft Error Models Accounting for Die-to-Die and Within-Die Variations in Sub-Threshold SRAM Cells. IEEE Trans. Very Large Scale Integr. Syst. 19(2): 182-195 (2011)

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