"A versatile paradigm for scan chain diagnosis of complex faults using ..."

Chao-Wen Tzeng, Jheng-Syun Yang, Shi-Yu Huang (2008)

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DOI: 10.1145/1297666.1297675

access: closed

type: Journal Article

metadata version: 2018-11-06

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Chao-Wen Tzeng, Jheng-Syun Yang, Shi-Yu Huang:
A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques. ACM Trans. Design Autom. Electr. Syst. 13(1): 9:1-9:27 (2008)

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