"DEMINER: test generation for high test coverage through mutant exploration."

Yunho Kim, Shin Hong (2021)

> Home

Details and statistics

DOI: 10.1002/STVR.1715

access: closed

type: Journal Article

metadata version: 2021-02-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/stvr/KimH21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/stvr/KimH21
Yunho Kim, Shin Hong:
DEMINER: test generation for high test coverage through mutant exploration. Softw. Test. Verification Reliab. 31(1-2) (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.