"Self-learning residual model for fast intra CU size decision in 3D-HEVC."

Yue Li et al. (2020)

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DOI: 10.1016/J.IMAGE.2019.115660

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type: Journal Article

metadata version: 2024-02-05

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Yue Li, Ningbo Zhu, Gaobo Yang, Yapei Zhu, Xiangling Ding:
Self-learning residual model for fast intra CU size decision in 3D-HEVC. Signal Process. Image Commun. 80 (2020)

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