"A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in ..."

Vincent Kerzerho et al. (2006)

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DOI: 10.1109/MDT.2006.59

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type: Journal Article

metadata version: 2020-05-17

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Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Des. Test Comput. 23(3): 234-243 (2006)

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