"Comprehensive Study for Detection of Weak Resistive Open and Short Defects ..."

Amit Karel et al. (2017)

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DOI: 10.1109/ISVLSI.2017.63

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type: Conference or Workshop Paper

metadata version: 2024-04-19

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Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh:
Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology. ISVLSI 2017: 320-325

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