"The forthcoming IEEE standard 1696 on test methods for characterizing ..."

Nicholas G. Paulter et al. (2013)

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DOI: 10.1109/I2MTC.2013.6555646

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-23

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Nicholas G. Paulter, John R. Jendzurski, Mike McTigue, Bill Hagerup, Thomas Linnenbrink:
The forthcoming IEEE standard 1696 on test methods for characterizing circuit probes. I2MTC 2013: 1412-1415

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