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ORCIDZhengfeng Huang
This is just a disambiguation page, and is not intended to be the bibliography of an actual person. Any publication listed on this page has not been assigned to an actual author yet. If you know the true author of one of the publications listed below, you are welcome to contact us.
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2020 – today
- 2024
[j109]Zhengfeng Huang, Zishuai Li
, Liting Sun, Huaguo Liang, Tianming Ni, Aibin Yan:
A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements. J. Electron. Test. 40(1): 19-30 (2024)- [j108]Yuqi Pan, Huaguo Liang, Junming Li, Jinxing Qu, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision. J. Electron. Test. 40(3): 405-415 (2024) - [j107]Hong Zhang, Huaguo Liang, Yue Wang, Danqing Li, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang:
Multi-transition delay test for improving the coverage of cell internal defects. IEICE Electron. Express 21(15): 20240326 (2024) - [j106]Hui Xu, Fuxin Tang, Pan Qi, Ye Yuan, Huaguo Liang, Zhengfeng Huang:
A self-training end-to-end mask optimization framework based on semantic segmentation network. Integr. 96: 102150 (2024) - [j105]Hui Xu, Shuo Zhu, Ruijun Ma, Zhengfeng Huang, Huaguo Liang, Haojie Sun, Chaoming Liu:
Design of novel low cost triple-node-upset self-recoverable hardened latch. Integr. 97: 102199 (2024) - [j104]Zhengfeng Huang, Yan Zhang, Lei Ai, Huaguo Liang, Tianming Ni, Tai Song, Aibin Yan:
Designs of High-Speed Triple-Node-Upset Hardened Latch Based on Dual-Modular-Redundancy. J. Circuits Syst. Comput. 33(5): 2450092:1-2450092:25 (2024) - [j103]Yiming Ouyang, Cheng Cao, Qi Wang, Zhengfeng Huang:
Applying SMART-Based Power Gating Approach in NoC System. J. Circuits Syst. Comput. 33(10) (2024) - [j102]Hui Xu, Chaoming Liu, Ruijun Ma, Tai Song, Zhengfeng Huang, Jun Wang, Xuewei Qin, Yu Xia:
Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments. Microelectron. J. 143: 106031 (2024) - [j101]Jingchang Bian, Zhengfeng Huang, Yankun Lin, Zhao Yang, Huaguo Liang, Tianming Ni:
Reliability analysis and comparison of ring-PUF based on probabilistic models. Microelectron. J. 144: 106072 (2024) - [j100]Aibin Yan, Han Bao, Wangjin Jiang, Jie Cui, Zhengfeng Huang, Xiaoqing Wen:
Efficient design approaches to CMOS full adder circuits. Microelectron. J. 149: 106235 (2024) - [j99]Hui Xu, Lin Tang, Ruijun Ma, Huaguo Liang, Zhengfeng Huang, Tianming Ni, Jiuqi Li, Xiaodong Ai:
A cost-effective and highly robust triple-node-upset self-recoverable latch design based on dual-output C-elements. Microelectron. J. 153: 106422 (2024) - [j98]Zhengfeng Huang, Xin Chen, Xinyu Jiang, Lei Ai, Huaguo Liang, Yiming Ouyang, Tianming Ni:
Design of radiation hardened latch with low delay and tolerance of quadruple-node-upset in 32 nm process. Microelectron. J. 153: 106428 (2024) - [j97]Zhengfeng Huang, Peng Ye, Ruixiang Liu, Jingchang Bian, Zhao Yang, Yingchun Lu, Yiming Ouyang, Huaguo Liang, Tianming Ni:
A lightweight reversible multi-mode physical unclonable function. Microelectron. J. 154: 106469 (2024) - [j96]Zhengfeng Huang, Liting Sun, Xu Wang, Huaguo Liang, Yingchun Lu, Aibin Yan, Jun Pan, Xiaoqing Wen:
NEST: A Quadruple-Node Upset Recovery Latch Design and Algorithm-Based Recovery Optimization. IEEE Trans. Aerosp. Electron. Syst. 60(4): 4590-4600 (2024) - [j95]Zhengfeng Huang, Jingchang Bian, Yankun Lin, Huaguo Liang, Tianming Ni:
Design Guidelines and Feedback Structure of Ring Oscillator PUF for Performance Improvement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(1): 71-84 (2024) - [j94]Aibin Yan, Zhixing Li, Zhongyu Gao, Jing Zhang, Zhengfeng Huang, Tianming Ni, Jie Cui, Xiaolei Wang, Patrick Girard, Xiaoqing Wen:
MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(7): 2205-2214 (2024) - [j93]Aibin Yan, Yu Chen, Zhongyu Gao, Tianming Ni, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen:
FeMPIM: A FeFET-Based Multifunctional Processing-in-Memory Cell. IEEE Trans. Circuits Syst. II Express Briefs 71(4): 2299-2303 (2024) - [j92]Tai Song, Zhengfeng Huang, Li Zhang, Qi Hong, Zhao Yang, Milos Krstic:
Test Cost Reduction for VLSI Adaptive Test With K-Nearest Neighbor Classification Algorithm. IEEE Trans. Circuits Syst. II Express Briefs 71(7): 3508-3512 (2024) - [j91]Shihao Yang, Huaguo Liang, Rong Hu, Liang Yao, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Lightweight Hybrid Entropy Source True Random Number Generator Based on Jitter and Metastability. IEEE Trans. Circuits Syst. II Express Briefs 71(7): 3513-3517 (2024) - [j90]Yiming Ouyang, Cheng Cao, Dongyu Xu, Wu Zhou, Zhengfeng Huang, Huaguo Liang:
DBU-PG: energy-efficient noc design using dual-buffering power gating. J. Supercomput. 80(10): 13632-13656 (2024) - [j89]Jingchang Bian, Zhengfeng Huang, Peng Ye, Zhao Yang, Huaguo Liang:
A Reliability-Aware Splitting Duty-Cycle Physical Unclonable Function Based on Trade-off Process, Voltage, and Temperature Variations. ACM Trans. Design Autom. Electr. Syst. 29(1): 5:1-5:16 (2024) - [j88]Qingsong Peng, Jingchang Bian, Zhengfeng Huang, Senling Wang, Aibin Yan:
A Compact TRNG Design for FPGA Based on the Metastability of RO-driven Shift Registers. ACM Trans. Design Autom. Electr. Syst. 29(1): 13:1-13:17 (2024) - [j87]Aibin Yan, Litao Wang, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Nonvolatile Latch Designs With Node-Upset Tolerance and Recovery Using Magnetic Tunnel Junctions and CMOS. IEEE Trans. Very Large Scale Integr. Syst. 32(1): 116-127 (2024) - [c49]Aibin Yan, Zhuoyuan Lin, Guangzhu Liu, Qingyang Zhang, Zhengfeng Huang, Jie Cui, Xiaoqing Wen, Patrick Girard:
Nonvolatile and SEU-Recoverable Latch Based on FeFET and CMOS for Energy-Harvesting Devices. ISCAS 2024: 1-5 - [c48]Jingchang Bian, Zhengfeng Huang, Ruixiang Liu, Yankun Lin, Zhao Yang, Huaguo Liang, Aibin Yan:
A RO-Integrated-LFSR-Based Nonlinear Strong PUF with Intrinsic Modeling Attacks Resilience. ITC-Asia 2024: 1-6 - [c47]Zhengfeng Huang, Yankun Lin, Fansheng Zeng, Jingchang Bian, Zhao Yang, Huaguo Liang, Yingchun Lu, Liang Yao, Xiaoqing Wen, Tianming Ni:
PFO PUF: A Lightweight Parallel Feed Obfuscation PUF Resistant to Machine Learning Attacks. ITC-Asia 2024: 1-6 - [c46]Xuehua Li, Jie Song, Chunjiong Zhang, Yuting He, Xiaoqing Wen, Zhengfeng Huang:
Multiple-Error Interceptive Voter Designs for Safety-Critical Applications. ITC-Asia 2024: 1-6 - 2023
- [j86]Aibin Yan, Yuting He, Xiaoxiao Niu, Jie Cui, Tianming Ni, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications. IEEE Des. Test 40(4): 34-41 (2023) - [j85]Tai Song, Zhengfeng Huang, Xiaohui Guo, Krstic Milos:
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation. J. Electron. Test. 39(2): 189-205 (2023) - [j84]Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan:
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. J. Electron. Test. 39(3): 289-301 (2023) - [j83]Yongxia Sheng, Huaguo Liang, Bao Fang, Cuiyun Jiang, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Design of approximate Booth multipliers based on error compensation. Integr. 90: 183-189 (2023) - [j82]Hui Xu, Jing Zhou, Ruijun Ma, Huaguo Liang, Zhengfeng Huang, Chaoming Liu:
LQNTL: Low-overhead quadruple-node-upset self-recovery latch based on triple-mode redundancy. Integr. 91: 126-135 (2023) - [j81]Hui Xu, Rui Zhu, Xia Sun, Xianjin Fang, Pan Qi, Huaguo Liang, Zhengfeng Huang:
Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation Prediction. J. Circuits Syst. Comput. 32(10): 2350175:1-2350175:19 (2023) - [j80]Zhengfeng Huang, Zhouyu Gong, Dongxing Ma, Xiaolei Wang, Yingchun Lu, Wenfa Zhan, Huaguo Liang, Tianming Ni:
Fault-avoidance C-element based low overhead and TNU-resilient latch. Microelectron. J. 131: 105650 (2023) - [j79]Hong Zhang, Huaguo Liang, Jiewen Hu, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang:
Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern. Microelectron. J. 138: 105841 (2023) - [j78]Aibin Yan, Jing Xiang, Yang Chang, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen:
Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications. Microelectron. J. 139: 105908 (2023) - [j77]Zhengfeng Huang, Lanxi Duan, Yan Zhang, Tianming Ni, Aibin Yan:
A Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch. IEEE Trans. Aerosp. Electron. Syst. 59(3): 2621-2632 (2023) - [j76]Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments. IEEE Trans. Aerosp. Electron. Syst. 59(3): 2885-2897 (2023) - [j75]Zhengfeng Huang, Dongxing Ma, Runwu Ji, Huaguo Liang, Aibin Yan, Tai Song, Tianming Ni:
Overhead Optimized and Quadruple-Node-Upset Self-Recoverable Latch Design Based on Looped C-Element Matrix. IEEE Trans. Aerosp. Electron. Syst. 59(6): 9357-9367 (2023) - [j74]Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen:
LDAVPM: A Latch Design and Algorithm-Based Verification Protected Against Multiple-Node-Upsets in Harsh Radiation Environments. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(6): 2069-2073 (2023) - [j73]Tianming Ni, Qingsong Peng, Jingchang Bian, Liang Yao, Zhengfeng Huang, Aibin Yan, Senling Wang, Xiaoqing Wen:
Design of True Random Number Generator Based on Multi-Ring Convergence Oscillator Using Short Pulse Enhanced Randomness. IEEE Trans. Circuits Syst. I Regul. Pap. 70(12): 5074-5085 (2023) - [j72]Aibin Yan, Aoran Cao, Zhengfeng Huang, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen, Jiliang Zhang:
Two Double-Node-Upset-Hardened Flip-Flop Designs for High-Performance Applications. IEEE Trans. Emerg. Top. Comput. 11(4): 1070-1081 (2023) - [j71]Yingchun Lu, Yun Yang, Rong Hu, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang, Yuanming Ma, Tian Chen, Liang Yao:
High-efficiency TRNG Design Based on Multi-bit Dual-ring Oscillator. ACM Trans. Reconfigurable Technol. Syst. 16(4): 64:1-64:23 (2023) - [j70]Wu Zhou, Yiming Ouyang, Dongyu Xu, Zhengfeng Huang, Huaguo Liang, Xiaoqing Wen:
Energy-Efficient Multiple Network-on-Chip Architecture With Bandwidth Expansion. IEEE Trans. Very Large Scale Integr. Syst. 31(4): 442-455 (2023) - [j69]Dongyu Xu, Yiming Ouyang, Wu Zhou, Zhengfeng Huang, Huaguo Liang, Xiaoqing Wen:
RMC_NoC: A Reliable On-Chip Network Architecture With Reconfigurable Multifunctional Channel. IEEE Trans. Very Large Scale Integr. Syst. 31(12): 2061-2074 (2023) - [c45]Aibin Yan, Yu Chen, Zhengfeng Huang, Jie Cui, Xiaoqing Wen:
A High-Performance and P-Type FeFET-Based Non-Volatile Latch. ATS 2023: 1-5 - [c44]Aibin Yan, Xuehua Li, Zhongyu Gao, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen:
Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications. ATS 2023: 1-5 - [c43]Aibin Yan, Zhen Zhou, Liang Ding, Jie Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard:
High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology. DATE 2023: 1-2 - [c42]Aibin Yan, Xuehua Li, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen:
A Robust and High-Performance Flip-Flop with Complete Soft-Error Recovery. DSA 2023: 474-476 - [c41]Aibin Yan, Yang Chang, Jing Xiang, Hao Luo, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen:
Two Highly Reliable and High-Speed SRAM Cells for Safety-Critical Applications. ACM Great Lakes Symposium on VLSI 2023: 293-298 - [c40]Zhengfeng Huang, Liushi Qin:
Intelligent Extraction of Color Features in Architectural Space Based on Machine Vision. ICMTEL (2) 2023: 40-56 - [c39]Liushi Qin, Zhengfeng Huang:
A Method of Indoor Space Layout for Home Stay Based on Binocular Vision SLAM. ICMTEL (1) 2023: 377-393 - [c38]Aibin Yan, Shaojie Wei, Zhixing Li, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Design of Low-Cost Approximate CMOS Full Adders. ISCAS 2023: 1-5 - [c37]Aibin Yan, Jing Xiang, Zhengfeng Huang, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen:
Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications. ITC-Asia 2023: 1-6 - [c36]Aibin Yan, Fan Xia, Tianming Ni, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
A Low Overhead and Double-Node-Upset Self-Recoverable Latch. ITC-Asia 2023: 1-5 - [c35]Aibin Yan, Chao Zhou, Shaojie Wei, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness. ITC-Asia 2023: 1-6 - 2022
- [j68]Tianming Ni, Jingchang Bian, Zhao Yang, Mu Nie, Liang Yao, Zhengfeng Huang, Aibin Yan, Xiaoqing Wen:
Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement. IEEE Des. Test 39(5): 34-42 (2022) - [j67]Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang:
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design. J. Electron. Test. 38(1): 63-76 (2022) - [j66]Tai Song, Tianming Ni, Zhengfeng Huang, Jinlei Wan:
Valid test pattern identification for VLSI adaptive test. Integr. 82: 1-6 (2022) - [j65]Aibin Yan, Kuikui Qian, Tai Song, Zhengfeng Huang, Tianming Ni, Yu Chen, Xiaoqing Wen:
A double-node-upset completely tolerant CMOS latch design with extremely low cost for high-performance applications. Integr. 86: 22-29 (2022) - [j64]Tai Song, Zhengfeng Huang, Aibin Yan:
Machine learning classification algorithm for VLSI test cost reduction. Integr. 87: 40-48 (2022) - [j63]Zhengfeng Huang, Wanshu Zhong, Lanxi Duan, Yue Zhang, Huaguo Liang, Jianan Wang, Tai Song, Yingchun Lu:
Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements. J. Circuits Syst. Comput. 31(13): 2250231:1-2250231:17 (2022) - [j62]Liang Yao, Huaguo Liang, Qian Han, Hong Zhang, Zhengfeng Huang, Cuiyun Jiang, Maoxiang Yi, Yingchun Lu:
M-RO PUF: A portable pure digital RO PUF based on MUX unit. Microelectron. J. 119: 105314 (2022) - [j61]Yanjie Wang, Huaguo Liang, Yuchuan Wang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu:
A reconfigurable PUF structure with dual working modes based on entropy separation model. Microelectron. J. 124: 105445 (2022) - [j60]Tai Song, Zhengfeng Huang, Xiaohui Guo:
RLDA: Valid test pattern identification by machine learning classification method for VLSI test. Microelectron. J. 128: 105549 (2022) - [j59]Aibin Yan, Zhengzheng Fan, Liang Ding, Jie Cui, Zhengfeng Huang, Qijun Wang, Hao Zheng, Patrick Girard, Xiaoqing Wen:
Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications. IEEE Trans. Aerosp. Electron. Syst. 58(1): 517-529 (2022) - [j58]Jianguo Cui, Maoxiang Yi, Di Cao, Liang Yao, Xinyu Wang, Huaguo Liang, Zhengfeng Huang, Haochen Qi, Tianming Ni, Yingchun Lu:
Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator. IEEE Trans. Circuits Syst. II Express Briefs 69(3): 1752-1756 (2022) - [j57]Aibin Yan, Zhelong Xu, Xiangfeng Feng, Jie Cui, Zhili Chen, Tianming Ni, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments. IEEE Trans. Emerg. Top. Comput. 10(1): 404-413 (2022) - [c34]Tianming Ni, Qingsong Peng, Jingchang Bian, Liang Yao, Zhengfeng Huang, Aibin Yan, Xiaoqing Wen:
MRCO: A Multi-ring Convergence Oscillator-based High-Efficiency True Random Number Generator. AsianHOST 2022: 1-6 - [c33]Aibin Yan, Liang Ding, Zhen Zhou, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen:
A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage. ATS 2022: 1-6 - [c32]Aibin Yan, Zhihui He, Jing Xiang, Jie Cui, Yong Zhou, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Two 0.8 V, Highly Reliable RHBD 10T and 12T SRAM Cells for Aerospace Applications. ACM Great Lakes Symposium on VLSI 2022: 261-266 - [c31]Aibin Yan, Yu Chen, Shukai Song, Zijie Zhai, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Sextuple Cross-Coupled-DICE Based Double-Node-Upset Recoverable and Low-Delay Flip-Flop for Aerospace Applications. ACM Great Lakes Symposium on VLSI 2022: 333-338 - [c30]Aibin Yan, Shukai Song, Jixiang Zhang, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen, Patrick Girard:
Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS. ITC-Asia 2022: 73-78 - [c29]Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard:
A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications. VTS 2022: 1-6 - 2021
- [j56]Tingting Sun, Zhengfeng Huang, Hongdong Zhu, Yanhao Huang, Pengjun Zheng:
Congestion Pattern Prediction for a Busy Traffic Zone Based on the Hidden Markov Model. IEEE Access 9: 2390-2400 (2021) - [j55]Hui Xu, Cong Sun, Le Zhou, Huaguo Liang, Zhengfeng Huang:
Design of a Highly Robust Triple-Node-Upset Self-Recoverable Latch. IEEE Access 9: 113622-113630 (2021) - [j54]Tai Song, Huaguo Liang, Zhengfeng Huang, Tianming Ni, Ying Sun:
Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs. IEICE Electron. Express 18(2): 20200420 (2021) - [j53]Bao Fang, Huaguo Liang, Dawen Xu, Maoxiang Yi, Yongxia Sheng, Cuiyun Jiang, Zhengfeng Huang, Yingchun Lu:
Approximate multipliers based on a novel unbiased approximate 4-2 compressor. Integr. 81: 17-24 (2021) - [j52]Zhengfeng Huang, Zian Su, Tianming Ni, Qi Xu, Haochen Qi, Yingchun Lu, Manzi Eric, Hui Xu:
Cross-Layer Dual Modular Redundancy Hardened Scheme of Flip-Flop Design Based on Sense-Amplifier. J. Circuits Syst. Comput. 30(5): 2120003:1-2120003:16 (2021) - [j51]Aibin Yan, Zhihui He, Jun Zhou, Jie Cui, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard:
Dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications. Microelectron. J. 111: 105034 (2021) - [j50]Zhengfeng Huang, Di Cao, Jianguo Cui, Yingchun Lu, Huaguo Liang, Yiming Ouyang, Tianming Ni, Zhenmin Li:
Design of node separated triple-node-upset self-recoverable latch. Microelectron. J. 114: 105111 (2021) - [j49]Zhengfeng Huang, Xiandong Li, Zhouyu Gong, Huaguo Liang, Yingchun Lu, Yiming Ouyang, Tianming Ni:
Design of MNU-Resilient latches based on input-split C-elements. Microelectron. J. 116: 105243 (2021) - [j48]Yuan Zhang, Huaguo Liang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu:
A high reliability physically unclonable function based on multiple tunable ring oscillator. Microelectron. J. 117: 105263 (2021) - [j47]Zhengfeng Huang, Shangjie Pan, Hao Wang, Huaguo Liang, Tianming Ni:
LC-TSL: A low-cost triple-node-upset self-recovery latch design based on heterogeneous elements for 22 nm CMOS. Microelectron. J. 117: 105281 (2021) - [j46]Zhengfeng Huang, Hao Wang, Yang Ang, Huaguo Liang, Yiming Ouyang, Tianming Ni:
A high-speed and triple-node-upset recovery latch with heterogeneous interconnection. Microelectron. J. 118: 105290 (2021) - [j45]Tianming Ni, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen:
A Cost-Effective TSV Repair Architecture for Clustered Faults in 3-D IC. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(9): 1952-1956 (2021) - [j44]Xinyu Wang, Huaguo Liang, Yanjie Wang, Liang Yao, Yang Guo, Maoxiang Yi, Zhengfeng Huang, Haochen Qi, Yingchun Lu:
High-Throughput Portable True Random Number Generator Based on Jitter-Latch Structure. IEEE Trans. Circuits Syst. I Regul. Pap. 68(2): 741-750 (2021) - [j43]Aibin Yan, Chaoping Lai, Yinlei Zhang, Jie Cui, Zhengfeng Huang, Jie Song, Jing Guo, Xiaoqing Wen:
Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS. IEEE Trans. Emerg. Top. Comput. 9(1): 520-533 (2021) - [j42]Tianming Ni, Zhao Yang, Hao Chang, Xiaoqiang Zhang, Lin Lu, Aibin Yan, Zhengfeng Huang, Xiaoqing Wen:
A Novel TDMA-Based Fault Tolerance Technique for the TSVs in 3D-ICs Using Honeycomb Topology. IEEE Trans. Emerg. Top. Comput. 9(2): 724-734 (2021) - [j41]Yingchun Lu, Xinyu Wang, Yanjie Wang, Yuan Zhang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Huaguo Liang:
Pure Digital Scalable Mixed Entropy Separation Structure for Physical Unclonable Function and True Random Number Generator. IEEE Trans. Very Large Scale Integr. Syst. 29(11): 1922-1929 (2021) - [c28]Yuanfan Xu, Zhaoliang Zhang, Jincheng Yu, Jianfei Cao, Haolin Dong, Zhengfeng Huang, Yu Wang, Huazhong Yang:
GAME: Gaussian Mixture Model Mapping and Navigation Engine on Embedded FPGA. FCCM 2021: 60-68 - [c27]Aibin Yan, Liang Ding, Chuanbo Shan, Haoran Cai, Xiaofeng Chen, Zhanjun Wei, Zhengfeng Huang, Xiaoqing Wen:
TPDICE and Sim Based 4-Node-Upset Completely Hardened Latch Design for Highly Robust Computing in Harsh Radiation. ISCAS 2021: 1-5 - [c26]Chang Hao, Zhengfeng Huang, Tianming Ni:
Kelvin Bridge Structure Based TSV Test for Weak Faults. ITC-Asia 2021: 1-6 - [c25]Huaguo Liang, Danqing Li, Zhao Yang, Tianming Ni, Zhengfeng Huang, Cuiyun Jiang:
A N: 1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICs. ITC-Asia 2021: 1-5 - [c24]Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen:
A Sextuple Cross-Coupled Dual-Interlocked-Storage-Cell based Multiple-Node-Upset Self-Recoverable Latch. NANOARCH 2021: 1-6 - 2020
- [j40]Yingchun Lu, Huaguo Liang, Liang Yao, Xinyu Wang, Haochen Qi, Maoxiang Yi, Cuiyun Jiang, Zhengfeng Huang:
Jitter-Quantizing-Based TRNG Robust Against PVT Variations. IEEE Access 8: 108482-108490 (2020) - [j39]Tai Song, Huaguo Liang, Tianming Ni, Zhengfeng Huang, Yingchun Lu, Jinlei Wan, Aibin Yan:
Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm. IEEE Access 8: 147965-147972 (2020) - [j38]Qi Xu, Song Chen, Hao Geng, Bo Yuan, Bei Yu, Feng Wu, Zhengfeng Huang:
Fault tolerance in memristive crossbar-based neuromorphic computing systems. Integr. 70: 70-79 (2020) - [j37]Tianming Ni, Yue Shu, Hao Chang, Lin Lu, Guangzhen Dai, Shidong Zhu, Chengming Qu, Zhengfeng Huang:
CC-RTSV: Cross-Cellular Based Redundant TSV Design for 3D ICs. J. Circuits Syst. Comput. 29(11): 2050144:1-2050144:19 (2020) - [j36]Aibin Yan, Zhelong Xu, Kang Yang, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
A Novel Low-Cost TMR-Without-Voter Based HIS-Insensitive and MNU-Tolerant Latch Design for Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 56(4): 2666-2676 (2020) - [j35]Aibin Yan, Yan Chen, Zhelong Xu, Zhili Chen, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches for Low-Power and Low-Orbit Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 56(5): 3931-3940 (2020) - [j34]Aibin Yan, Yuanjie Hu, Jie Cui, Zhili Chen, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment. IEEE Trans. Computers 69(6): 789-799 (2020) - [j33]Tianming Ni, Yao Yao, Hao Chang, Lin Lu, Huaguo Liang, Aibin Yan, Zhengfeng Huang, Xiaoqing Wen:
LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2938-2951 (2020) - [j32]Aibin Yan, Yafei Ling, Jie Cui, Zhili Chen, Zhengfeng Huang, Jie Song, Patrick Girard, Xiaoqing Wen:
Quadruple Cross-Coupled Dual-Interlocked-Storage-Cells-Based Multiple-Node-Upset-Tolerant Latch Designs. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(3): 879-890 (2020) - [j31]Tianming Ni, Hao Chang, Tai Song, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen:
Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC. IEEE Trans. Circuits Syst. 67-II(11): 2657-2661 (2020) - [j30]Tianming Ni, Dongsheng Liu, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan:
Architecture of Cobweb-Based Redundant TSV for Clustered Faults. IEEE Trans. Very Large Scale Integr. Syst. 28(7): 1736-1739 (2020) - [c23]Jincheng Yu, Feng Gao, Jianfei Cao, Chao Yu, Zhaoliang Zhang, Zhengfeng Huang, Yu Wang, Huazhong Yang:
CNN-based Monocular Decentralized SLAM on embedded FPGA. IPDPS Workshops 2020: 66-73 - [c22]Aibin Yan, Zhelong Xu, Jie Cui, Zuobin Ying, Zhengfeng Huang, Huaguo Liang, Patrick Girard, Xiaoqing Wen:
Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications. ISCAS 2020: 1-5 - [c21]Zhengfeng Huang, Xiandong Li, Shangjie Pan, Min Wang, Tianming Ni:
A SEU Immune Flip-Flop with Low Overhead. ML4CS (2) 2020: 56-65
2010 – 2019
- 2019
- [j29]Xuan Li, Lili Lu, Pengjun Zheng, Zhengfeng Huang:
Timetable Coordination of the First Trains for Subway Network With Maximum Passenger Perceived Transfer Quality. IEEE Access 7: 52042-52051 (2019) - [j28]Tianming Ni, Hao Chang, Yao Yao, Xueyun Li, Zhengfeng Huang:
A Novel Built-In Self-Repair Scheme for 3D Memory. IEEE Access 7: 65052-65059 (2019) - [j27]Tianming Ni, Hao Chang, Shidong Zhu, Lin Lu, Xueyun Li, Qi Xu, Huaguo Liang, Zhengfeng Huang:
Temperature-Aware Floorplanning for Fixed-Outline 3D ICs. IEEE Access 7: 139787-139794 (2019) - [j26]Aibin Yan, Jun Zhou, Yuanjie Hu, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets. IEEE Access 7: 176188-176196 (2019) - [j25]Tianming Ni, Hao Chang, Xian Sun, Xia Xiuzhen, Zhengfeng Huang:
An enhanced time-to-digital conversion solution for pre-bond TSV dual faults testing. IEICE Electron. Express 16(3): 20181105 (2019) - [j24]Yiming Ouyang, Yang Zhao, Kun Xing, Zhengfeng Huang, Huaguo Liang, Jianhua Li:
Design of Wireless Network on Chip with Priority-Based MAC. J. Circuits Syst. Comput. 28(8): 1950124:1-1950124:18 (2019) - [j23]Aibin Yan, Kang Yang, Zhengfeng Huang, Jiliang Zhang, Jie Cui, Xiangsheng Fang, Maoxiang Yi, Xiaoqing Wen:
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application. IEEE Trans. Circuits Syst. II Express Briefs 66-II(2): 287-291 (2019) - [c20]Zhiyuan Song, Aibin Yan, Jie Cui, Zhili Chen, Xuejun Li, Xiaoqing Wen, Chaoping Lai, Zhengfeng Huang, Huaguo Liang:
A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells. ITC-Asia 2019: 139-144 - [c19]Tai Song, Huaguo Liang, Ying Sun, Zhengfeng Huang, Maoxiang Yi, Xiangsheng Fang, Aibin Yan:
Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory. VTS 2019: 1-6 - 2018
- [j22]Tianming Ni, Hao Chang, Xiaoqiang Zhang, Hao Xiao, Zhengfeng Huang:
Research on physical unclonable functions circuit based on three dimensional integrated circuit. IEICE Electron. Express 15(23): 20180782 (2018) - [j21]Tianming Ni, Hao Chang, Haochen Qi, Zhengfeng Huang:
A novel in-field TSV repair method for latent faults. IEICE Electron. Express 15(23): 20180873 (2018) - [j20]Zhengfeng Huang, Zhaodong Huang, Pengjun Zheng, Wenjun Xu:
Calibration of C-Logit-Based SUE Route Choice Model Using Mobile Phone Data. Inf. 9(5): 115 (2018) - [j19]Yiming Ouyang, Jianfeng Yang, Kun Xing, Zhengfeng Huang, Huaguo Liang:
An improved communication scheme for non-HOL-blocking wireless NoC. Integr. 60: 240-247 (2018) - [j18]Yiming Ouyang, Zhe Li, Kun Xing, Zhengfeng Huang, Huaguo Liang, Jianhua Li:
Design of Low-Power WiNoC with Congestion-Aware Wireless Node. J. Circuits Syst. Comput. 27(9): 1850148:1-1850148:18 (2018) - [c18]Gaoliang Ma, Huaguo Liang, Liang Yao, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Kai Zhou:
A Low-Cost High-Efficiency True Random Number Generator on FPGAs. ATS 2018: 54-58 - [c17]Xiumin Xu, Huaguo Liang, Kai Zhou, Gaoliang Ma, Zhengfeng Huang, Maoxiang Yi, Tianming Ni, Yingchun Lu:
An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs. ATS 2018: 59-62 - [c16]Kai Zhou, Huaguo Liang, Yue Jiang, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Yao Yao:
A High Reliability FPGA Chip Identification Generator Based on PDLs. ATS 2018: 63-67 - [c15]Zhengfeng Huang, Yangyang Zhang, Zian Su, Huaguo Liang, Huijie Yao, Tianming Ni:
A Hybrid DMR Latch to Tolerate MNU Using TDICE and WDICE. ATS 2018: 121-126 - [c14]Aibin Yan, Zhile Chen, Zhengfeng Huang, Xiangsheng Fang, Maoxiang Yi, Jing Guo:
Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique. ITC-Asia 2018: 49-54 - 2017
- [j17]Aibin Yan, Huaguo Liang, Yingchun Lu, Zhengfeng Huang:
A transient pulse dually filterable and online self-recoverable latch. IEICE Electron. Express 14(2): 20160911 (2017) - [j16]Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yingchun Lu, Aibin Yan, Tianming Ni, Maoxiang Yi:
A single event transient detector in SRAM-based FPGAs. IEICE Electron. Express 14(12): 20170210 (2017) - [j15]Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yiming Ouyang, Xiangsheng Fang, Tianming Ni, Maoxiang Yi:
A highly reliable butterfly PUF in SRAM-based FPGAs. IEICE Electron. Express 14(14): 20170551 (2017) - [j14]Tianming Ni, Mu Nie, Huaguo Liang, Jingchang Bian, Xiumin Xu, Xiangsheng Fang, Zhengfeng Huang, Xiaoqing Wen:
Vernier ring based pre-bond through silicon vias test in 3D ICs. IEICE Electron. Express 14(18): 20170590 (2017) - [j13]Huaguo Liang, Xin Li, Zhengfeng Huang, Aibin Yan, Xiumin Xu:
Highly Robust Double Node Upset Resilient Hardened Latch Design. IEICE Trans. Electron. 100-C(5): 496-503 (2017) - [j12]Tianming Ni, Huaguo Liang, Mu Nie, Xiumin Xu, Aibin Yan, Zhengfeng Huang:
A Region-Based Through-Silicon via Repair Method for Clustered Faults. IEICE Trans. Electron. 100-C(12): 1108-1117 (2017) - [j11]Aibin Yan, Zhengfeng Huang, Xiangsheng Fang, Yiming Ouyang, Honghui Deng:
Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS. Microelectron. J. 61: 43-50 (2017) - [j10]Aibin Yan, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Yiming Ouyang, Huaguo Liang:
Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology. IEEE Trans. Very Large Scale Integr. Syst. 25(6): 1978-1982 (2017) - [c13]Aibin Yan, Zhengfeng Huang, Maoxiang Yi, Jie Cui, Huaguo Liang:
HLDTL: High-performance, low-cost, and double node upset tolerant latch design. VTS 2017: 1-6 - 2016
- [j9]Zhengfeng Huang, Pengjun Zheng, Yanqiang Ma, Guiyan Jiang, Gang Ren:
Proactive Control for Oversaturation Mitigation on Evacuation Network: a Multi-Agent Simulation Approach. Int. J. Comput. Intell. Syst. 9(6): 1055-1067 (2016) - [j8]Aibin Yan, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yiming Ouyang, Xuejun Li:
An SEU resilient, SET filterable and cost effective latch in presence of PVT variations. Microelectron. Reliab. 63: 239-250 (2016) - [c12]Aibin Yan, Zhengfeng Huang, Xiangsheng Fang, Xiaolin Xu, Huaguo Liang:
Novel Low Cost and Double Node Upset Tolerant Latch Design for Nanoscale CMOS Technology. ATS 2016: 252-256 - [c11]Maoxiang Yi, Xiaohong Liu, Qingwu Wu, Tianming Ni, Zhengfeng Huang, Huaguo Liang:
NBTI mitigation by M-IVC with input duty cycle and randomness constraints. EWDTS 2016: 1-5 - [c10]Maoxiang Yi, Yingxian Gan, Zhengfeng Huang, Huaguo Liang:
Co-mitigating circuit PBTI and HCI aging considering NMOS transistor stacking effect. ISIC 2016: 1-5 - 2015
- [j7]Zhengfeng Huang, Huaguo Liang, Sybille Hellebrand:
A High Performance SEU Tolerant Latch. J. Electron. Test. 31(4): 349-359 (2015) - [j6]Aibin Yan, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Maoxiang Yi:
A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology. IEICE Trans. Electron. 98-C(12): 1171-1178 (2015) - [j5]Gang Ren, Zhengfeng Huang, Lili Lu, Jingyi Hua, Jinghui Wang:
Method of generating strategic guidance information for driving evacuation flows to approach safety-based system optimal dynamic flows: Case study of a large stadium. J. Syst. Sci. Complex. 28(3): 606-622 (2015) - [c9]Huaguo Liang, Yangyang Dai, Maoxiang Yi, Dawen Xu, Zhengfeng Huang:
MTTF-Aware Reliability Task Scheduling for Heterogeneous Multicore System. ICA3PP (2) 2015: 716-727 - 2014
- [c8]Huaguo Liang, Zhi Wang, Zhengfeng Huang, Aibin Yan:
Design of a Radiation Hardened Latch for Low-Power Circuits. ATS 2014: 19-24 - [c7]Zhengfeng Huang:
A high performance SEU-tolerant latch for nanoscale CMOS technology. DATE 2014: 1-5 - 2013
- [j4]Jincheng Zhu, Bin Shuai, Zhengfeng Huang, Chaoyuan Sun:
The Optimal Taxi Fleet Size Structure under Various Market Regimes When Charging Taxis with Link-Based Toll. J. Appl. Math. 2013: 535878:1-535878:11 (2013) - [c6]Luming Yan, Huaguo Liang, Zhengfeng Huang:
A dynamic self-adaptive correction method for error resilient application. DATE 2013: 943-946 - 2010
- [j3]Wenfa Zhan, Huaguo Liang, Cuiyun Jiang, Zhengfeng Huang, Aiman H. El-Maleh:
A scheme of test data compression based on coding of even bits marking and selective output inversion. Comput. Electr. Eng. 36(5): 969-977 (2010)
2000 – 2009
- 2008
- [c5]Zhengfeng Huang, Huaguo Liang:
A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies. IOLTS 2008: 175-176 - [c4]Maoxiang Yi, Huaguo Liang, Zhengfeng Huang:
Balancing wrapper chains of SoC core based on best interchange decreasing. SoC 2008: 1-4 - 2007
- [j2]Wenfa Zhan, Huaguo Liang, Feng Shi, Zhengfeng Huang:
Test data compression scheme based on variable-to-fixed-plus-variable-length coding. J. Syst. Archit. 53(11): 877-887 (2007) - [c3]Wenfa Zhan, Huaguo Liang, Feng Shi, Zhengfeng Huang:
A Novel Collaborative Scheme of Test Data Compression Based on Fixed-Plus-variable-Length Coding. CSCWD 2007: 1044-1049 - 2005
- [c2]Li Deng, Wenyong Zhang, Haiyan Xu, Ruihong Wang, Zhengfeng Huang, Shu Li:
A New Algorithm for Reducing Communication Cost of Time-dependent Monte Carlo Transport. Parallel and Distributed Computing and Networks 2005: 657-662 - 2004
- [j1]Zeyao Mo, Zhengfeng Huang:
Application of MPI-IO in Parallel Particle Transport Monte-Carlo Simulation. Parallel Algorithms Appl. 19(4): 227-236 (2004) - 2003
- [c1]Li Deng, Jie Liu, Wenyong Zhang, Guoxing Yuan, Zhengfeng Huang, Haiyan Xu, Ruihong Wang, Shu Li:
The Parallel Communication of Time-Dependent Monte Carlo Transport. ICPP Workshops 2003: 223-229
Coauthor Index
[j109] [j108] [j107] [j106] [j105] [j104] [j101] [j99] [j98] [j97] [j96] [j95] [j91] [j90] [j89] [c48] [c47] [j84] [j83] [j82] [j81] [j80] [j79] [j75] [j71] [j70] [j69] [j67] [j63] [j62] [j61] [j58] [j55] [j54] [j53] [j50] [j49] [j48] [j47] [j46] [j45] [j44] [j41] [c25] [j40] [j39] [j33] [j31] [j30] [c22] [j27] [j24] [c20] [c19] [j19] [j18] [c18] [c17] [c16] [c15] [j17] [j16] [j15] [j14] [j13] [j12] [j10] [c13] [j8] [c12] [c11] [c10] [j7] [j6] [c9] [c8] [c6] [j3] [c5] [c4] [j2] [c3]
[j109] [j104] [j101] [j99] [j98] [j97] [j95] [j94] [j93] [j87] [c47] [j86] [j80] [j77] [j76] [j75] [j74] [j73] [j72] [c44] [c42] [c41] [c37] [c36] [j68] [j66] [j65] [j58] [j57] [c34] [c30] [j54] [j52] [j51] [j50] [j49] [j47] [j46] [j45] [j42] [c26] [c25] [c24] [j39] [j37] [j34] [j33] [j31] [j30] [c21] [j28] [j27] [j25] [j22] [j21] [c17] [c15] [j16] [j15] [j14] [j12] [c11]
[j100] [j96] [j94] [j93] [j87] [c49] [c47] [c46] [j86] [j78] [j76] [j74] [j73] [j72] [j70] [j69] [c45] [c44] [c43] [c42] [c41] [c38] [c37] [c36] [c35] [j68] [j65] [j59] [j57] [c34] [c33] [c32] [c31] [c30] [c29] [j51] [j45] [j43] [j42] [c27] [c24] [j36] [j35] [j34] [j33] [j32] [j31] [c22] [j26] [j23] [c20] [j14]
[j109] [j104] [j100] [j96] [j94] [j93] [j88] [j87] [c49] [c48] [j86] [j84] [j78] [j77] [j76] [j75] [j74] [j73] [j72] [c45] [c44] [c43] [c42] [c41] [c38] [c37] [c36] [c35] [j68] [j65] [j64] [j59] [j57] [c34] [c33] [c32] [c31] [c30] [c29] [j51] [j45] [j43] [j42] [c27] [c24] [j39] [j36] [j35] [j34] [j33] [j32] [j31] [j30] [c22] [j26] [j23] [c20] [c19] [c14] [j17] [j16] [j13] [j12] [j11] [j10] [c13] [j8] [c12] [j6] [c8]
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