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ORCIDMaria V. Ortiz Segovia
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2010 – 2019
- 2018
[c26]Theo Phan Van Song, Christine Andraud
, Luis Ricardo Sapaico, Maria V. Ortiz Segovia:
Color prediction based on individual characterizations of ink layers and print support. Material Appearance 2018: 1-6- 2017
- [c25]Bin Jin, Maria V. Ortiz Segovia, Sabine Süsstrunk:
Webly Supervised Semantic Segmentation. CVPR 2017: 1705-1714 - [c24]Fayez Lahoud, Bin Jin, Maria V. Ortiz Segovia, Sabine Süsstrunk:
Keyword-based image color re-rendering with semantic segmentation. ICIP 2017: 2936-2940 - [c23]Theo Phan Van Song, Christine Andraud, Maria V. Ortiz Segovia:
Spectral predictions of rough ink layers using a four-flux model. CIC 2017: 251-257 - 2016
- [c22]Teun Baar, Hans Brettel, Maria V. Ortiz Segovia:
Relating Optical and Geometric Surface Characteristics for Gloss Management in Printing Applications. Measuring, Modeling, and Reproducing Material Appearance 2016: 1-14 - [c21]Teun Baar, Sepideh Samadzadegan, Philipp Urban, Maria V. Ortiz Segovia:
Interrelation between gloss and texture perception of 2.5D-printed surfaces. Measuring, Modeling, and Reproducing Material Appearance 2016: 1-6 - [c20]Carinna Parraman, Maria V. Ortiz Segovia:
An exploration of 2.5D printing as tactile pictures. Measuring, Modeling, and Reproducing Material Appearance 2016: 1 - [c19]Ni Yan, Teun Baar, Maria V. Ortiz Segovia, Jan P. Allebach:
Fitting analytical BRDF models to low-resolution measurements of light scattered from relief printing samples. Measuring, Modeling, and Reproducing Material Appearance 2016: 1-6 - [c18]Bin Jin, Maria V. Ortiz Segovia, Sabine Süsstrunk:
Image aesthetic predictors based on weighted CNNs. ICIP 2016: 2291-2295 - [c17]Theo Phan Van Song, Christine Andraud, Maria V. Ortiz Segovia:
Towards spectral prediction of 2.5D prints for soft-proofing applications. IPTA 2016: 1-6 - [e3]Francisco H. Imai, Maria V. Ortiz, Philipp Urban:
Measuring, Modeling, and Reproducing Material Appearance 2016, San Francisco, CA, USA, February 14-18, 2016. Society for Imaging Science and Technology 2016 [contents] - 2015
- [c16]Teun Baar, Hans Brettel, Maria V. Ortiz Segovia:
Towards gloss control in fine art reproduction. Measuring, Modeling, and Reproducing Material Appearance 2015: 93980T - [c15]Sepideh Samadzadegan, Teun Baar, Philipp Urban, Maria V. Ortiz Segovia, Jana Blahová:
Controlling colour-printed gloss by varnish-halftones. Measuring, Modeling, and Reproducing Material Appearance 2015: 93980V - [c14]Bin Jin, Gökhan Yildirim, Cheryl Lau, Appu Shaji, Maria V. Ortiz Segovia, Sabine Süsstrunk:
Modeling the importance of faces in natural images. Human Vision and Electronic Imaging 2015: 93940V - [e2]Maria V. Ortiz Segovia, Philipp Urban, Francisco H. Imai:
Measuring, Modeling, and Reproducing Material Appearance 2015, San Francisco, California, United States, February 9-10, 2015. SPIE Proceedings 9398, SPIE 2015, ISBN 9781628414882 [contents] - 2014
- [j2]Mehdi Felhi, Salvatore Tabbone, Maria V. Ortiz Segovia:
Approche hybride de segmentation de pages à base d'un descripteur de traits. Document Numérique 17(3): 9-30 (2014) - [c13]Mehdi Felhi, Salvatore Tabbone, Maria V. Ortiz Segovia:
Approche hybride de segmentation de page à base d'un descripteur de traits. CORIA-CIFED 2014: 11-23 - [c12]Mehdi Felhi, Salvatore Tabbone, Maria V. Ortiz Segovia:
Multiscale Stroke-Based Page Segmentation Approach. Document Analysis Systems 2014: 6-10 - [c11]Teun Baar, Sepideh Samadzadegan, Hans Brettel, Philipp Urban, Maria V. Ortiz Segovia:
Printing gloss effects in a 2.5D system. Measuring, Modeling, and Reproducing Material Appearance 2014: 90180M - [c10]Teun Baar, Marjan Shahpaski, Maria V. Ortiz Segovia:
Image ghosting reduction in lenticular relief prints. Measuring, Modeling, and Reproducing Material Appearance 2014: 90180N - [c9]Xing Liu, Lin Chen, Maria-Valezzka Ortiz-Segovia, James A. Ferwerda, Jan P. Allebach:
Characterization of relief printing. Measuring, Modeling, and Reproducing Material Appearance 2014: 90180P - [c8]Jianyu Wang, Jan P. Allebach, Maria V. Ortiz Segovia:
Semantically-based 2.5D texture printing. ICIP 2014: 2634-2638 - [c7]Teun Baar, Maria V. Ortiz Segovia, Hans Brettel:
Colour Management of Prints with Variant Gloss. CIC 2014: 48-52 - [e1]Maria V. Ortiz Segovia, Philipp Urban, Jan P. Allebach:
Measuring, Modeling, and Reproducing Material Appearance 2014, San Francisco, California, USA, February 2-6, 2014. SPIE Proceedings 9018, SPIE 2014, ISBN 9780819499356 [contents] - 2013
- [c6]Teun Baar, Hans Brettel, Maria V. Ortiz Segovia:
A survey of 3D image quality metrics for relief print evaluation. CVCS 2013: 1-6 - 2012
- [c5]Maria V. Ortiz Segovia, Nicolas Bonnier, Jan P. Allebach:
Ink-saving strategy based on document content characterization and halftone textures. Color Imaging: Displaying, Processing, Hardcopy, and Applications 2012: 829211 - [c4]Maria V. Ortiz Segovia, Nicolas Bonnier, Jan P. Allebach:
Print quality analysis for ink-saving algorithms. IQSP 2012: 82930Q - 2011
- [c3]Maria V. Ortiz Segovia, Niranjan Damera-Venkata, Eamonn O'Brien-Strain, Jian Fan, Suk Hwan Lim, Sam Liu, Jerry Liu, Qian Lin, Jan P. Allebach:
Aesthetic role of transparency and layering in the creation of photo layouts. Imaging and Printing in a Web 2.0 World 2011: 78790B - 2010
- [p1]Pei-Ju Chiang, Nitin Khanna, Aravind K. Mikkilineni, Maria V. Ortiz Segovia, Jan P. Allebach, George T.-C. Chiu, Edward J. Delp:
Printer and Scanner Forensics: Models and Methods. Intelligent Multimedia Analysis for Security Applications 2010: 145-187
2000 – 2009
- 2009
- [j1]Pei-Ju Chiang, Nitin Khanna, Aravind K. Mikkilineni, Maria V. Ortiz Segovia, Sungjoo Suh, Jan P. Allebach, George T.-C. Chiu, Edward J. Delp:
Printer and scanner forensics. IEEE Signal Process. Mag. 26(2): 72-83 (2009) - [c2]Maria V. Ortiz Segovia, George T.-C. Chiu, Jan P. Allebach:
Using forms for information hiding and coding in electrophotographic documents. WIFS 2009: 136-140 - 2007
- [c1]Nitin Khanna, Aravind K. Mikkilineni, Pei-Ju Chiang, Maria V. Ortiz, Sungjoo Suh, George T.-C. Chiu, Jan P. Allebach, Edward J. Delp:
Sensor Forensics: Printers, Cameras and Scanners, They Never Lie. ICME 2007: 20-23
Coauthor Index
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