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ORCIDLuis Carlos Méndez-González
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2020 – today
- 2024
[j14]Iván Juan Carlos Pérez-Olguín, Consuelo Catalina Fernández-Gaxiola
, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González:
Characterization and Dataset Compilation of Torque-Angle Curve Behavior for M2/M3 Screws. Data 9(10): 115 (2024)- 2023
- [j13]Florencio Abraham Roldán-Castellanos, Iván Juan Carlos Pérez-Olguín, Aimeé Gutiérrez-Vázquez, Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón:
Emotional Classification Method (ECW): A Methodology for Measuring Emotional Sustainability in a Work Environment Utilizing Artificial Intelligence. Axioms 12(2): 97 (2023) - [j12]Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez-Olguín, Luis Ricardo Vidal Portilla:
An Additive Chen Distribution with Applications to Lifetime Data. Axioms 12(2): 118 (2023) - [j11]Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez-Olguín, Vicente García, Abel Eduardo Quezada-Carreón:
A reliability analysis for electronic devices under an extension of exponentiated perks distribution. Qual. Reliab. Eng. Int. 39(3): 776-795 (2023) - [j10]Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Iván Juan Carlos Pérez-Olguín, Jesús Israel Hernández Hernández:
A Gamma Process with Three Sources of Variability. Symmetry 15(1): 162 (2023) - 2022
- [j9]Paulo Eduardo García-Nava, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Iván Juan Carlos Pérez-Olguín:
A Study of Stopping Rules in the Steepest Ascent Methodology for the Optimization of a Simulated Process. Axioms 11(10): 514 (2022) - 2021
- [j8]Vicente García, J. Salvador Sánchez, Rafael Martínez-Peláez, Luis Carlos Méndez-González:
Revisiting the Dissimilarity Representation in the Context of Regression. IEEE Access 9: 157043-157051 (2021)
2010 – 2019
- 2019
- [j7]Vicente García, J. Salvador Sánchez, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Humberto de Jesús Ochoa Domínguez:
Using regression models for predicting the product quality in a tubing extrusion process. J. Intell. Manuf. 30(6): 2535-2544 (2019) - [j6]Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Alejandro Alvarado-Iniesta, Abel Eduardo Quezada-Carreón:
Reliability analysis using exponentiated Weibull distribution and inverse power law. Qual. Reliab. Eng. Int. 35(4): 1219-1230 (2019) - 2018
- [j5]Luis Alberto Rodríguez-Picón, Anna Patricia Rodríguez-Picón, Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Alejandro Alvarado-Iniesta:
Degradation modeling based on gamma process models with random effects. Commun. Stat. Simul. Comput. 47(6): 1796-1810 (2018) - 2017
- [j4]Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Roberto Romero-López, Abel Eduardo Quezada-Carreón:
Reliability analysis for electronic devices using beta-Weibull distribution. Qual. Reliab. Eng. Int. 33(8): 2521-2530 (2017) - 2016
- [j3]Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Delia J. Valles-Rosales, Arturo Del Valle, Arnoldo Rodriguez:
Reliability Model for Electronic Devices under Time Varying Voltage. Qual. Reliab. Eng. Int. 32(4): 1295-1306 (2016) - [j2]Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle:
Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution. Qual. Reliab. Eng. Int. 32(8): 2901-2908 (2016) - [j1]Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Manuel R. Piña-Monarrez, Roberto Ambrosio, Arturo Del Valle:
Reliability Analysis for Laptop Computer Under Electrical Harmonics. Qual. Reliab. Eng. Int. 32(8): 2945-2960 (2016)
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