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Ephraim Suhir
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2020 – today
- 2022
- [j11]Ephraim Suhir:
Probabilistic Fitts' Law with Application to Spacecraft Collision with an Asteroid. J. Aerosp. Inf. Syst. 19(10): 694-698 (2022) - 2020
- [c4]Ephraim Suhir, Sofia Scataglini, Gunther Paul:
Extraordinary Automated Driving Situations: Probabilistic Analytical Modeling of Human-Systems-Integration (HSI) and the Role of Trust. AHFE (6) 2020: 323-329 - [c3]Ephraim Suhir, Gunther Paul, Hermann Kaindl:
Towards Probabilistic Analysis of Human-System Integration in Automated Driving. IHSI 2020: 9-14
2010 – 2019
- 2016
- [c2]Ephraim Suhir, Sung Yi:
Predicted thermal stresses in a TSV design. 3DIC 2016: 1-4 - 2015
- [j10]A. Bensoussan, Ephraim Suhir, P. Henderson, M. Zahir:
A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validation. Microelectron. Reliab. 55(9-10): 1729-1735 (2015) - [c1]Ephraim Suhir, A. Bensoussan, Golta Khatibi, Johann Nicolics:
Probabilistic design for reliability in electronics and photonics: Role, significance, attributes, challenges. IRPS 2015: 5 - 2014
- [j9]Amirkoushyar Ziabari, Ephraim Suhir, Ali Shakouri:
Minimizing thermally induced interfacial shearing stress in a thermoelectric module with low fractional area coverage. Microelectron. J. 45(5): 547-553 (2014) - [j8]Ephraim Suhir:
Thermal stress in through-silicon-vias: Theory-of-elasticity approach. Microelectron. Reliab. 54(5): 972-977 (2014) - [j7]Ephraim Suhir:
Three-step concept (TSC) in modeling microelectronics reliability (MR): Boltzmann-Arrhenius-Zhurkov (BAZ) probabilistic physics-of-failure equation sandwiched between two statistical models. Microelectron. Reliab. 54(11): 2594-2603 (2014) - 2013
- [j6]Ephraim Suhir:
Could electronics reliability be predicted, quantified and assured? Microelectron. Reliab. 53(7): 925-936 (2013) - [j5]Ephraim Suhir, Laurent Béchou:
Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testing. Microelectron. Reliab. 53(9-11): 1506-1509 (2013) - 2012
- [j4]Ephraim Suhir:
When adequate and predictable reliability is imperative. Microelectron. Reliab. 52(9-10): 2342-2346 (2012) - 2010
- [j3]Walter Gschohsmann, Johann Nicolics, Ephraim Suhir:
Elastizitätsmodell eines keramischen Sensorstreifens bei longitudinaler Verformung. Elektrotech. Informationstechnik 127(10): 279-284 (2010)
2000 – 2009
- 2008
- [j2]Ephraim Suhir, Jyrki Joutsensalo:
Portable 2008 - Second ieee international interdisciplinary intersociety conference on pids. IEEE Veh. Technol. Mag. 3(1): 36-38 (2008) - 2007
- [j1]Ephraim Suhir:
Response of a heavy electronic component to harmonic excitations applied to its external electric leads. Elektrotech. Informationstechnik 124(9): 309-314 (2007)
Coauthor Index
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